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Atomic Force Microscope Park Systems has positioned itself not only as Korea’s AFM technology leader, but also as the preferred nanotechnology solutions partner, with the business aim of solving the challenging tasks regarding nanoscale research and industrial applications.
Park Systems provides original and innovative AFM solutions for the most accurate nanoscale measurement. In nanoscale metrology, having data that is repeatable, reproducible, and reliable is just as crucial as resolution. Hard Disk Drive (HDD) manufacturers can now reliably depend on Park Systems’ XE-PTR, a fully automated industrial in-line AFM for automatic Pole
Tip Recession measurements on rowbar-level sliders.
As most HDD manufacturers are turning to PMR (Perpendicular Magnetic Recording), sub-nano scale accuracy, repeatability, and throughput are the keys to slider inspection for improving the overall yield. Matching the highest resolution AFM in the world with the lowest one gauge sigma value for repeatability and reproduction, the XE-PTR is the perfect solution for slider manufacturers who, until now, had very limited choices for industrial grade in line inspection tools for HDD slider metrology.
Park Systems serves its customers with advanced atomic force microscopes and global service and global support via direct offices in Korea, Japan, Singapore, and the United States. For over 25 years, Park Systems has developed a reputation as the AFM technology leader and the preferred nanotechnology solutions partner among major universities, research institutes and industry leaders who demand the most precise metrology for the most challenging problems in their fields.
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