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Invented in 1986 at Stanford University, Atomic Force Microscope is one of the foremost tools in nanoscale measurement and imaging. The AFM can resolve features as small as an atomic lattice in real space, more than 1,000 times better than the optical diffraction limit. The XE-Bio, an innovative yet user-friendly AFM from Park System is designed specifically for bio-medical and other advanced lifescience research.
The modular design of XE-Bio provides the user with a wide array of imaging modes including a revolutionary Scanning Ion Conductance Microscopy module which makes XE-Bio ideal for imaging biological samples in dynamic conditions such as living cells.
HDD Slider manufacturers can now reliably depend on Park System’s XE-PTR, a fully automated industrial in-line AFM for automatic Pole Tip Measurements on rowbar-level sliders. Matching the highest resolution in the world with the lowest one-gauge sigma value imaginable for repeatability and reproduction, the XE-PTR is the perfect solution for slider manufacturers who, until now, had very limited choice of industrial grade in-line inspection tools for HDD slider metrology.
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